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Persistent URL http://purl.org/net/epubs/work/17806368
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Record Id 17806368
Title Measuring Failure Probability of Coarse and Fine Grain TMR Schemes in SRAM-based FPGAs Under Neutron-Induced Effects
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Organisation ISIS , ISIS-VESUVIO , STFC , ISIS-CHIPIR
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Language English (EN)
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Paper In Conference Proceedings In 11th International Symposium (ARC 2015), Bochum, Germany, 13-17 Apr 2015, Lecture Notes in Computer Science 9040 (2015): 331-338. doi:10.1007/978-3-319-16214-0_28 2015
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