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Persistent URL http://purl.org/net/epubs/work/22911007
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Record Id 22911007
Title Aging and Voltage Scaling Impacts under Neutron-induced Soft Error Rate in SRAM-based FPGAs
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Organisation ISIS , STFC
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Language English (EN)
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Paper In Conference Proceedings In 19th IEEE European Test Symposium (ETS), Paderborn, GERMANY, 26-30 May 2014, Proceedings of the European Test Symposium (2014). 2014