ePubs

The open archive for STFC research publications

Full Record Details

Persistent URL http://purl.org/net/epubs/work/22911007
Record Status Checked
Record Id 22911007
Title Aging and Voltage Scaling Impacts under Neutron-induced Soft Error Rate in SRAM-based FPGAs
Contributors
Abstract
Organisation ISIS , STFC
Keywords
Funding Information
Related Research Object(s):
Language English (EN)
Type Details URI(s) Local file(s) Year
Paper In Conference Proceedings In 19th IEEE European Test Symposium (ETS), Paderborn, GERMANY, 26-30 May 2014, Proceedings of the European Test Symposium (2014). 2014
Showing record 1 of 1