ePubs

The open archive for STFC research publications

Full Record Details

Persistent URL http://purl.org/net/epubs/work/26210
Record Status Checked
Record Id 26210
Title Characterization of PTFE on silicon wafer tribological transfer films by XPS, imaging XPS and AFM
Contributors
Abstract
Organisation CCLRC , SND
Keywords
Funding Information
Related Research Object(s):
Language English (EN)
Type Details URI(s) Local file(s) Year
Preprint DL Preprints DL-P-95-012 1995. 1995
Showing record 1 of 1
RCUK
Science and Technology Facilities Council Switchboard: 01793 442000