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Persistent URL	http://purl.org/net/epubs/work/27911
Record Status	Checked
Record Id	27911
Title	Single event upset studies on the APV25 front end readout chip
Contributors	J R Fulcher (Imperial Coll., London), G Hall (Imperial Coll., London), E Noah (Imperial Coll., London), M Raymond (Imperial Coll., London), D Bisello (Padua U.), A Paccagnella (Padua U.), J Wyss (Padua U.), F Faccio (CERN), M Huhtinen (CERN), M French (Rutherford), L Jones (Rutherford)
Abstract
Organisation	CCLRC
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Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Presentation	Presented at 6th Workshop on Electronics for LHC Experiments, Cracow, Poland, 11-15 Sep 2000.			2000