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Persistent URL http://purl.org/net/epubs/work/30286
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Record Id 30286
Title Surface and subsurface oxide formation on Ni(1 0 0) and Ni(1 1 1)
Abstract The oxidation of Ni(1 0 0) and Ni(1 1 1) at elevated temperatures and large oxygen exposures, typical of the methods used in the preparation of NiO(1 0 0) films for surface studies, has been investigated by medium energy ion scattering (MEIS) using 100 keV H+ incident ions. Oxide film growth proceeds significantly faster on Ni(1 1 1) than on Ni(1 0 0), but on both surfaces oxide penetration occurs to depths significantly greater than 100 with total exposures of 1200 and 6000 L respectively. The metal/oxide interface is extremely rough, with metallic Ni extending to the surface, even for much thicker oxide films on Ni(1 1 1). On Ni(1 1 1), NiO growth occurs with the (1 0 0) face parallel to the Ni(1 1 1) surface and the close-packed 1 1 0 directions parallel. On Ni(1 0 0) the MEIS blocking curves cannot be reconciled with a single orientation of NiO(1 0 0) (with the 1 1 0 directions parallel) on the surface, but is consistent with the substantial orientational disorder (including tilt) previously identified by spot-profile analysis LEED.
Organisation CCLRC , SND , MEIS
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Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article Surf Sci 565, no. 1 (2004): 1-13. doi:10.1016/j.susc.2004.06.204 2004
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