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Persistent URL http://purl.org/net/epubs/work/32243
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Record Id 32243
Title In-Situ direct measurement of activation energies for the generation of misfit dislocations in the InGaAs/GaAs (001) system.
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Organisation CCLRC , SRS , 9.4
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Language English (EN)
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Journal Article Appl Surf Sci 123/124 (1998): 718-724. doi:10.1016/S0169-4332(97)00477-7 1998
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