ePubs

The open archive for STFC research publications

Full Record Details

Persistent URL http://purl.org/net/epubs/work/34097826
Record Status Checked
Record Id 34097826
Title Bias dependence of muon-induced single event upsets in 28 nm static random access memories
Contributors
Abstract
Organisation ISIS , ISIS-MUONS , STFC
Keywords
Funding Information
Related Research Object(s):
Licence Information:
Language English (EN)
Type Details URI(s) Local file(s) Year
Paper In Conference Proceedings In 2014 IEEE International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA, 1-5 Jun 2014, (2014): 2B.2.1-2B.2.5. doi:10.1109/IRPS.2014.6860585 2014