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Persistent URL http://purl.org/net/epubs/work/34097826
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Record Id 34097826
Title Bias dependence of muon-induced single event upsets in 28 nm static random access memories
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Organisation ISIS , ISIS-MUONS , STFC
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Language English (EN)
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Paper In Conference Proceedings In 2014 IEEE International Reliability Physics Symposium (IRPS), Waikoloa, Hawaii, USA, 1-5 Jun 2014, (2014): 2B.2.1-2B.2.5. doi:10.1109/IRPS.2014.6860585 2014
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