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Persistent URL	http://purl.org/net/epubs/work/34134
Record Status	Checked
Record Id	34134
Title	Current-induced chain migration in semiconductor polymer blends
Contributors	SJ Martin (Sheffield U.), RAL Jones (Sheffield U.), M Geoghegan (Sheffield U.), AM Higgins (Swansea U.), I Grizzi (CDT Ltd.), JJM Halls (CDT Ltd.), S Kirchmeyer (H.C. Stark GmbH), RM Dalgliesh (CCLRC Rutherford Appleton Lab.)
Abstract	We have used the technique of neutron reflectometry in order to evaluate the changes that occur within polymer light-emitting devices as they are operated. The devices examined consisted of an indium-tin-oxide, anode, a deuterated-polysstyrene sulfonated/polys3,4 ethylenedioxythiophened, sd-PSS/PEDTd, charge injection layer, polysfluorened, sF8d, and a low work-function cathode.We found clear evidence for segregation of d-PSS to the d-PSS:PEDT/F8 interface in a device driven until its brightness had fallen to 10% of its initial value. We suggest that this effect is due to Joule heating of the device during operation.
Organisation	CCLRC , ISIS , ISIS-CRISP
Keywords	Physics , Migration , Polymer , Current Induced , Blends , ISIS 2005
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Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Journal Article	Phys Rev B 71 (2005): 081308.	doi:10.1103/PhysRevB.71.081308		2005