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Persistent URL http://purl.org/net/epubs/work/34460090
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Record Id 34460090
Title Single-Event Upset Technology Scaling Trends of Unhardened and Hardened Flip-Flops in Bulk CMOS
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Abstract
Organisation ISIS , STFC
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Language English (EN)
Type Details URI(s) Local file(s) Year
Thesis PhD, Vanderbilt University, Nashville, 2016. https://irbe.libr…c5de1956f3dc/content 2016