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Persistent URL http://purl.org/net/epubs/work/42850
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Record Id 42850
Title Ellipsometric and MEIS Studies of 4H-SiC/Si/SiO2 and 4H-SiC/SiO2 Interfaces for MOS Devices
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Abstract
Organisation CCLRC , MEIS
Keywords Materials
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Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article Mater Sci Forum 556-557 (2007): 509-512. doi:10.4028/www.s….net/MSF.556-557.509 2007