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Persistent URL	http://purl.org/net/epubs/work/49957171
Record Status	Checked
Record Id	49957171
Title	SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
Contributors	A Coronetti (CERN), M Cecchetto (CERN), J Wang (KU Leuven), M Tali (CERN), PF Martinez (CERN), M Kastriotou (CERN), A Papadopoulou (CERN), K Bilko (CERN), F Castellani (ISAE Supaero), M Sacristan (CERN), RG Alia (CERN), C Cazzaniga (STFC Rutherford Appleton Lab.), Y Morilla (Centro Nacional de Aceleradores), P Martin-Holgado (Centro Nacional de Aceleradores), M van Goethem (KVI-CART), H Kiewiet (KVI-CART), E van der Graaf (KVI-CART), S Brandenburg (KVI-CART), W Hajdas (PSI), L Sinkunaite (PSI), M Marszalek (PSI), H Kettunen (University of Jyväskylä), M Rossi (University of Jyväskylä), J Jaatinen (University of Jyväskylä), A Javanainen (Vanderbilt University), M Moscatello (Boulevar Henri Becquerel), A Dubois (Boulevar Henri Becquerel), S Fiore (ENEA Centro Ricerche Frascati), G Bazzano (ENEA Centro Ricerche Frascati), C Frost (STFC Rutherford Appleton Lab.), M Letiche (Institute Laue Langevin), W Farabolini (CERN), A Gilardi (Università Degli Studi Di Napoli Federico II), R Corsini (CERN), H Puchner (Cypress Semiconductors)
Abstract
Organisation	ISIS , STFC , ISIS-CHIPIR
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Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Paper In Conference Proceedings	In 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), Santa Fe, New Mexico, USA, 29 Nov 2020 - 30 Dec 2020, (2020): 1-8.	doi:10.1109/REDW51883.2020.9325822		2020