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Persistent URL http://purl.org/net/epubs/work/49957171
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Record Id 49957171
Title SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
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Organisation ISIS , STFC , ISIS-CHIPIR
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Language English (EN)
Type Details URI(s) Local file(s) Year
Paper In Conference Proceedings In 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), Santa Fe, New Mexico, USA, 29 Nov 2020 - 30 Dec 2020, (2020): 1-8. doi:10.1109/REDW51883.2020.9325822 2020