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Persistent URL http://purl.org/net/epubs/work/49957171
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Record Id 49957171
Title SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below
Organisation ISIS , STFC , ISIS-CHIPIR
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Language English (EN)
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Paper In Conference Proceedings In 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), Santa Fe, New Mexico, USA, 29 Nov 2020 - 30 Dec 2020, (2020): 1-8. doi:10.1109/REDW51883.2020.9325822 2020