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Persistent URL http://purl.org/net/epubs/work/50300
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Record Id 50300
Title An instrument for combining x-ray multiple diffraction and x-ray topographic imaging for examining crystal microcrystallography and perfection
Abstract Diffraction imaging using x-ray topography XRTand x-ray multiple diffraction XRMD provide valuable tools for examining the growth defects in crystals and the distributions from ideal lattice symmetry microcrystallography. The topographic x-ray multiple diffraction microprobe TMDM combines the complementary aspects of both techniques enabling XRT and XRMD studies within the same instrument providing a useful resource for the structural characterization of materials that are not very stable in vacuum and electron beam environments. The design of the TMDM instrument is described together with data taken on GaAs 001 and potassium dihydrogen phosphate 001.
Organisation CSE , TECH , STFC
Keywords instrumentation diffraction topography , Materials
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Language English (EN)
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Journal Article Rev Sci Instrum 80 (2009): 033705. doi:10.1063/1.3103571 2009