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Persistent URL http://purl.org/net/epubs/work/54185387
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Record Id 54185387
Title Study on changes in electrical and switching characteristics of NPT-IGBT devices by fast neutron irradiation
Contributors
Abstract
Organisation ISIS , STFC , ISIS-CHIPIR
Keywords fast neutron irradiation , total ionizing dose effect , displacement damage effect , insulated gate bipolar transistor , CHIPIr
Funding Information NST; MSIP (CAP-18-04-KRISS); NRF (1711078081); NRF (NRF-2020M3H4A3081882)
Related Research Object(s):
Licence Information: Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0)
Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article Nuclear Engineering and Technology 55, no. 9 (2023): 3334-3341. doi:10.1016/j.net.2023.05.034 2023