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Persistent URL http://purl.org/net/epubs/work/56528218
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Record Id 56528218
Title Depth Dependence of Neutron-induced Errors in 3D NAND Floating Gate Cells
Contributors
Abstract
Organisation ISIS , STFC
Keywords atmospheric neutrons , floating gate cells , flash memory , soft errors , single-event effects
Funding Information A SI (Gamma-Flash Project)
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Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article IEEE Trans Nucl Sci 71, no. 4 (2023): 508-514. doi:10.1109/TNS.2023.3345011 2023