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Persistent URL http://purl.org/net/epubs/work/59525467
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Record Id 59525467
Title Neutron Radiation-Induced Failure Rate of 650 V Lateral GaN Power Devices
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Abstract
Organisation ISIS , STFC , ISIS-CHIPIR
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Funding Information Deutsche Forschungsgemeinschaft (EXC 2163/1)
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Language English (EN)
Type Details URI(s) Local file(s) Year
Paper In Conference Proceedings In 2024 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe (WiPDA Europe), Cardiff, United Kingdom, 16-18 Sept 2024, (2024): 1-5. doi:10.1109/WiPDA…e62087.2024.10797418 2024