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Persistent URL http://purl.org/net/epubs/work/61188717
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Record Id 61188717
Title From Ground to Orbit: A Robust and Efficient Test Methodology for RISC-V Soft-Cores
Contributors
Abstract
Organisation ISIS , STFC , ISIS-CHIPIR
Keywords fault tolerance , software , field programmable gate arrays , testing , reliability , life estimation , neutrons , measurement , radiation testing , soft-core , RISC-V , protons , flash-based FPGA , ionizing radiation , hardware
Funding Information KDT JU (101095947)
Related Research Object(s):
Licence Information:
Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article IEEE Transactions on Device and Materials Reliability (2025): 1-1. doi:10.1109/TDMR.2025.3537718 2025