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Persistent URL http://purl.org/net/epubs/work/63348247
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Record Id 63348247
Title Further characterisation of digital pixel test structures implemented in a 65 nm CMOS process
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Organisation TECH , STFC , TECH-CMOS
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Licence Information: Creative Commons Attribution 4.0 International (CC BY 4.0)
Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article Nucl Instrum Meth A 1083 (2026): 171082. doi:10.1016/j.nima.2025.171082 2026