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Persistent URL http://purl.org/net/epubs/work/64634
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Record Id 64634
Title Evolution of non-ionic surfactant-templated silicate films at the air-liquid interface
Abstract Spontaneous growth of non-ionic surfactant-templated thin films at the air-water interface was investigated using three techniques: Brewster angle microscopy (BAM), time-resolved off-specular X-ray reflectivity and grazing incidence X-ray diffraction (GIXD). Experiments were also carried out to study the evolution of micelles in the subphase solution using small-angle neutron scattering (SANS). Films were prepared in acidic conditions using octaethylene glycol mono-n-hexadecyl ether (C16EO8) as the surfactant and tetramethyloxysilane (TMOS) as the silica precursor. Three different TMOS-C16EO8 molar ratios (3.5, 7.1 and 10.8) were studied. Variation of the silica-precursor concentration causes a significant effect on the film-formation time, the solution and film-growth mechanisms and the final film structure.
Organisation ISIS , ISIS-LOQ , STFC
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Language English (EN)
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Journal Article J Mater Chem 18, no. 11 (2008): 1222-1231. doi:10.1039/B716662A 2008