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Persistent URL	http://purl.org/net/epubs/work/64778609
Record Status	Checked
Record Id	64778609
Title	Multi-technique characterizations of single-event burnout (SEB) in silicon carbide (SiC) power MOSFETs
Contributors	F Pintacuda, F Principato, C Cazzaniga (STFC Rutherford Appleton Lab.), L Fazi, CD Frost (STFC Rutherford Appleton Lab.), M Kastriotou (STFC Rutherford Appleton Lab.), S Licoccia, T Marino, T Minniti, V Pietrosanti, A Prioriello, G Romanelli, C Santillo, C Andreani
Abstract
Organisation	ISIS , STFC , ISIS-CHIPIR , ISIS@MACH ITALIA
Keywords
Funding Information	Università degli Studi di Roma Tor Vergata
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Licence Information:	Creative Commons Attribution 4.0 International (CC BY 4.0)
Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Journal Article	Eur Phys J Plus 141, no. 2 (2026): 162.	doi:10.1140/epjp/s13360-026-07303-6		2026

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