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Persistent URL	http://purl.org/net/epubs/work/67813247
Record Status	Checked
Record Id	67813247
Title	Special session paper: simulation methodologies and experiments for reliability analysis of devices in radiation harsh environments
Contributors	N Chatzivangelis (University of Thessaly), N Zazatis (University of Montpellier), W Grignani (University of Montpellier), G Paliaroutis (University of Thessaly), DA Santos (University of Montpellier), C Imianosky (University of Montpellier), M Kastriotou (STFC Rutherford Appleton Lab.), C Cazzaniga (STFC), F Wrobel (University of Montpellier), A Veronesi (IHP - Leibniz-Institut für innovative Mikroelektronik), C Sotiriou (University of Thessaly), M Andjelkovic (IHP - Leibniz-Institut für innovative Mikroelektronik), FL Vargas (IHP - Leibniz-Institut für innovative Mikroelektronik), D Bertozzi (University of Manchester), L Dilillo (University of Montpellier)
Abstract
Organisation	ISIS , STFC
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Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Paper In Conference Proceedings	In 2025 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Barcelona, Spain, 21-23 Oct 2025, (2025): 1-8.	doi:10.1109/DFT66274.2025.11257502		2025