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Persistent URL http://purl.org/net/epubs/work/8061
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Record Id 8061
Title Depth profiling of phase composition and texture in layered-graded Al2O3- & Ti3SiC2- based systems using x-ray and synchroton radiation diffraction
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Abstract
Organisation CCLRC , ISIS , HRPD
Keywords Materials , ISIS 2002 , ISIS 2002 Update
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Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article Key Eng Mater 224-226 (2002): 505. doi:10.4028/www.s….net/KEM.224-226.505 2002
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Science and Technology Facilities Council Switchboard: 01793 442000