Secondary Emission Monitor for keV Ion and Antiproton Beams

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Persistent URL	http://purl.org/net/epubs/work/10854492
Record Status	Checked
Record Id	10854492
Title	Secondary Emission Monitor for keV Ion and Antiproton Beams
Contributors	A Sosa (Cockcroft Inst., Liverpool Univ., and CERN), A Jeff (Cockcroft Inst., Liverpool Univ., and CERN), E Bravin, J Harasimowicz (Cockcroft Inst., and Liverpool Univ.), CP Welsch (Cockcroft Inst., and Liverpool Univ.)
Abstract	Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Secondary electron Emission Monitor (SEM) has been designed to measure profiles of beams with intensities below 107 and energies as low as 20 keV. The monitor is based on a two stage microchannel plate (MCP) and a phosphor screen facing a CCD camera. Its modular design allows two different operational setups. In this contribution we present the design of a prototype and discuss results from measurements with antiprotons at the AEgIS experiment at CERN. This is then used for a characterization of the monitor with regard to its possible future use at different facilities.
Organisation	CI , AEgIS
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Language	English (EN)

Type	Details	URI(s)	Local file(s)	Year
Paper In Conference Proceedings	In 2nd International Beam Instrumentation Conference (IBIC 2013), Oxford, UK, 16-19 Sept 2013, (2013).		Cockcroft-13-29.PDF	2013