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Persistent URL http://purl.org/net/epubs/work/10854492
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Record Id 10854492
Title Secondary Emission Monitor for keV Ion and Antiproton Beams
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Abstract Beam profile monitoring of low intensity keV ion and antiproton beams remains a challenging task. A Secondary electron Emission Monitor (SEM) has been designed to measure profiles of beams with intensities below 107 and energies as low as 20 keV. The monitor is based on a two stage microchannel plate (MCP) and a phosphor screen facing a CCD camera. Its modular design allows two different operational setups. In this contribution we present the design of a prototype and discuss results from measurements with antiprotons at the AEgIS experiment at CERN. This is then used for a characterization of the monitor with regard to its possible future use at different facilities.
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Language English (EN)
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Paper In Conference Proceedings In 2nd International Beam Instrumentation Conference (IBIC 2013), Oxford, UK, 16-19 Sep 2013, (2013). Cockcroft-13-29.PDF 2013
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