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Full Record Details
Persistent URL
http://purl.org/net/epubs/work/12240053
Record Status
Checked
Record Id
12240053
Title
Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs
Contributors
F Kastensmidt
,
J Tonfat
,
T Both
,
P Rech
,
G Wirth
,
R Reis
,
F Bruguier
,
P Benoit
,
L Torres
,
C Frost (STFC Rutherford Appleton Lab.)
Abstract
Organisation
ISIS
,
STFC
,
ISIS-CHIPIR
Keywords
Funding Information
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Language
English (EN)
Type
Details
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Year
Journal Article
Microelectron Reliab
54, no. 9-10 (2014): 2344-2348.
doi:10.1016/j.microrel.2014.07.100
2014
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