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Persistent URL http://purl.org/net/epubs/work/12240053
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Record Id 12240053
Title Voltage scaling and aging effects on soft error rate in SRAM-based FPGAs
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Organisation ISIS , STFC
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Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article Microelectronics Reliability 54, no. 9-10 (2014): 2344-2348. doi:10.1016/j.microrel.2014.07.100 2014
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