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Persistent URL http://purl.org/net/epubs/work/22530176
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Record Id 22530176
Title Measuring the Impact of Voltage Scaling for Soft Errors in SRAM-based FPGAs from a Designer Perspective
Organisation ISIS , STFC
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Language English (EN)
Type Details URI(s) Local file(s) Year
Paper In Conference Proceedings In 19th International Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), Porto Alegre, BRAZIL, 17-18 Sep 2014, (2015). doi:10.1109/IMS3TW.2014.6997398 2015