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Persistent URL http://purl.org/net/epubs/work/29449
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Record Id 29449
Title Medium-energy ion scattering studies of two dimensional rare-earth silicides
Abstract Medium-energy ion scattering (MEIS) has been used to determine the atomic structure of two-dimensional (2D) rare-earth silicides on Si(111). In the case of the Si(111)1 x 1-Er 2D silicide surface, the MEIS results refine previously published results, but in the case of the Si(111)1 x 1-Ho surface, this work represents to our knowledge the first full quantitative structural analysis that reveals a structure similar to that of the Si(111)1 x 1-Er surface and directly supports a model in which a rare-earth monolayer resides below a Si bilayer close to bulklike termination
Organisation CCLRC , SND , MEIS
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Language English (EN)
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Journal Article Phys Rev B 61 (2000): 5707-5713. doi:10.1103/PhysRevB.61.5707 2000