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Persistent URL http://purl.org/net/epubs/work/29593
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Record Id 29593
Title Surface EXAFS - a mathematical model
Abstract Extended x-ray absorption fine structure (EXAFS) studies are a powerful technique for studying the chemical environment of specific atoms in a molecular or solid matrix. When applied to the study of the surfaces of thick samples it becomes necessary to measure the fluorescent products of the primary x-ray absorption cross-section. These products (fluorescent x-rays and auger electrons) must escape from the surface to be detected. This process is governed by the properties of the emitted radiation and of the material. It can easily destroy the linear relation between the detected signal and the absorption cross-section. Also affected are the probe depth within the surface (important in studies of catalytic layers) and the background superimposed on the detected emission signal. A general mathematical model of the escape processes is developed which permits the optimisation of the detection modality (x-rays or electrons) and the experimental variables to suit the composition of any given surface under study.
Organisation CCLRC
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Language English (EN)
Type Details URI(s) Local file(s) Year
Report RAL Technical Reports RAL-TR-2000-052. 2000. raltr-2000052.pdf 2000