ePubs

The open archive for STFC research publications

Full Record Details

Persistent URL http://purl.org/net/epubs/work/30768723
Record Status Checked
Record Id 30768723
Title Muon-induced soft errors in 16-nm NAND flash memories
Contributors
Abstract
Organisation ISIS , ISIS-RIKEN , ISIS-MUONS , STFC
Keywords
Funding Information
Related Research Object(s):
Language English (EN)
Type Details URI(s) Local file(s) Year
Paper In Conference Proceedings In 2016 IEEE International Reliability Physics Symposium (IRPS 2016), Pasadena, California, USA, 17-21 May 2016, (2016): 5C-1-1-5C-1-5. doi:10.1109/IRPS.2016.7574552 2016
Showing record 1 of 1