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Persistent URL http://purl.org/net/epubs/work/30768723
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Record Id 30768723
Title Muon-induced soft errors in 16-nm NAND flash memories
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Organisation ISIS , ISIS-RIKEN , ISIS-MUONS , STFC
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Language English (EN)
Type Details URI(s) Local file(s) Year
Paper In Conference Proceedings In 2016 IEEE International Reliability Physics Symposium (IRPS 2016), Pasadena, California, USA, 17-21 May 2016, (2016): 5C-1-1-5C-1-5. doi:10.1109/IRPS.2016.7574552 2016