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Persistent URL http://purl.org/net/epubs/work/32477
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Record Id 32477
Title In-situ x-ray topography studies during the molecular-beam epitaxy growth of Ingaas on (001) GaAs-effects of substrate dislocation distribution on strain relaxation.
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Organisation CCLRC , SRS
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Language English (EN)
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Journal Article J Phys D Appl Phys 28 (1995): 17-22. doi:10.1088/0022-3727/28/4A/003 1995
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