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Full Record Details
Persistent URL
http://purl.org/net/epubs/work/32519
Record Status
Checked
Record Id
32519
Title
X-ray topography of lattice-relaxation in strained-layer semiconductors-postgrowth studies and a new faculty for insitu topography during MBE growth.
Contributors
SJ Barnett
,
CR Whitehouse
,
AM Keir
,
GF Clark
,
B Usher
,
BK Tanner
,
MT Emeny
,
AD Johnson
Abstract
Organisation
SRS
,
DRAL
Keywords
Funding Information
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Language
English (EN)
Type
Details
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Year
Journal Article
J Phys D Appl Phys
26 (1993): 45-49.
doi:10.1088/0022-3727/26/4A/010
1993
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