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Persistent URL http://purl.org/net/epubs/work/34070642
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Record Id 34070642
Title Comparison Studies of Graphene Sey Results in NSRL and DL
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Abstract Graphene has many excellent properties, such as high electron carrier mobility, good thermal conductivity and transparency etc. The secondary electron yield (SEY) of graphene with copper substrate had been studied in National Synchrotron Radiation Laboratory (NSRL) of China. The results show that the maximum SEY ('max) of 6~8 layers graphene film with copper substrates is about 1.25. Further studies indicate that many factors can affect the SEY test results. The recent SEY tests of graphene films with copper substrates in Daresbury Laboratory (DL) of UK gave the maximum SEY of as-received copper, graphene samples with copper substrates are 1.89, 1.83, and 1.68, respectively, under the incident charge per unit surface (Q) of 7.6×10-8 C 'mm-2. Meanwhile, the SEY test parameters and measurement results of graphene in both laboratories are compared and analysed. The effect of defects on the SEY results of graphene films with copper substrate is also discussed.
Organisation ASTeC , CI , STFC
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Language English (EN)
Type Details URI(s) Local file(s) Year
Paper In Conference Proceedings In 8th International Particle Accelerator Conference (IPAC'17), Copenhagen, Denmark, 14-19 May 2017, (2017): 3196-3199. http://accelconf.…/papers/wepik107.pdf 2017
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