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Persistent URL http://purl.org/net/epubs/work/34541
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Record Id 34541
Title A medium-energy ion scattering investigation of the structure and surface vibrations of two-dimensional YSi2 grown on Si(1 1 1)
Abstract Medium-energy ion scattering has been used to determine the atomic structure of two-dimensional yttrium silicide on silicon (1 1 1). A full quantitative analysis of the atomic positions of the Si atoms in the top bilayer yields a model similar to that previously suggested in the literature with a Si1–Si2 vertical spacing of 0.80 ± 0.03 Å, but with the Si bilayer relaxed slightly further away from the Y layer (Si2–Y vertical spacing of 1.89 ± 0.02 Å). Observing the effects of the top bilayer vibrations yields a model with significant enhancements.
Organisation CCLRC , MEIS
Keywords Physics
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Language English (EN)
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Journal Article Surf Sci 598, no. 1-3 (2005): 120-127. doi:10.1016/j.susc.2005.08.032 2005