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Persistent URL http://purl.org/net/epubs/work/4211
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Record Id 4211
Title Structure of self-assembled layers on silicon: Combined use of spectroscopic variable angle ellipsometry, neutron reflection and atomic force microscopy
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Abstract
Organisation CCLRC , ISIS , CRISP , SURF
Keywords Chemistry , ISIS 2001
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Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article J Appl Phys 85 (1999): 1. doi:10.1063/1.369205 1999
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