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Persistent URL http://purl.org/net/epubs/work/45185198
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Record Id 45185198
Title Soft Error Performance of High-Speed Pulsed-DICE-Latch Design in 16 nm and 7 nm FinFET Processes
Organisation ISIS , STFC , ISIS-CHIPIR
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Language English (EN)
Type Details URI(s) Local file(s) Year
Paper In Conference Proceedings In 2019 IEEE International Reliability Physics Symposium, Monterey, California, USA, 31 Mar 2019 - 4 Apr 2019, (2019): 1-4. doi:10.1109/IRPS.2019.8720408 2019
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