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Persistent URL http://purl.org/net/epubs/work/48177370
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Record Id 48177370
Title Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems
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Organisation ISIS , STFC , ISIS-CHIPIR
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Language English (EN)
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Paper In Conference Proceedings In 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Frascati, Italy, 19-21 Oct 2020, (2020): 1-6. doi:10.1109/DFT50435.2020.9250865 2020