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Persistent URL http://purl.org/net/epubs/work/48177370
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Record Id 48177370
Title Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems
Organisation ISIS , STFC , ISIS-CHIPIR
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Language English (EN)
Type Details URI(s) Local file(s) Year
Paper In Conference Proceedings In 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Frascati, Italy, 19-21 Oct 2020, (2020): 1-6. doi:10.1109/DFT50435.2020.9250865 2020