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Persistent URL http://purl.org/net/epubs/work/48856901
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Record Id 48856901
Title Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node
Organisation ISIS , STFC , ISIS-CHIPIR
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Language English (EN)
Type Details URI(s) Local file(s) Year
Paper In Conference Proceedings In 2020 IEEE International Reliability Physics Symposium (IRPS), Dallas, TX, USA, 28 Apr 2020 - 30 May 2020, (2020): 1-5. doi:10.1109/IRPS45951.2020.9128360 2020