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Persistent URL http://purl.org/net/epubs/work/48856955
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Record Id 48856955
Title Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET
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Abstract
Organisation ISIS , STFC , ISIS-CHIPIR
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Funding Information H2020 (721624)
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Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article IEEE Trans Nucl Sci 67, no. 7 (2020): 1365-1373. doi:10.1109/TNS.2020.2983599 2020