ePubs

The open archive for STFC research publications

Full Record Details

Persistent URL http://purl.org/net/epubs/work/51518
Record Status Checked
Record Id 51518
Title Development of ReflEXAFS data analysis for deeper surface structure studies
Contributors
Abstract An analytical approach to the analysis of ReflEXAFS data collected from complex multilayer samples, at a range of angles above and below the critical angle is presented. The aim of the technique is to generate a structural model of the investigated system that is consistent with the variable depth sensitivity of the experimental data. The procedure follows three main steps (i) the determination of the free atom reflectivity background for the multilayer system, (ii) the estimation of the depth dependent EXAFS signals and (iii) the calculation of the corresponding ReflEXAFS components. By iterating between steps (ii) and (iii), and varying the estimates of the EXAFS signals, a consistent set of structural parameters is extracted that reflects the bulk structure of the multilayer system through the basic reflectivity signals, and the depth dependent local atomic structure through the estimated EXAFS components. An example of the depth dependent structure of copper in a copper-chromium multilayer stack is presented to illustrate the capabilities of the method.
Organisation ISIS , GEN , STFC
Keywords Materials , Multilayers , Reflectivity , EXAFS , Diamond Light Source
Funding Information
Related Research Object(s):
Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article J Phys Conf Ser 190 (2009): 012110. doi:10.1088/1742-6596/190/1/012110 2009
Showing record 1 of 1
RCUK
Science and Technology Facilities Council Switchboard: 01793 442000