ePubs

The open archive for STFC research publications

Full Record Details

Persistent URL http://purl.org/net/epubs/work/52225
Record Status Checked
Record Id 52225
Title A new analytical method for characterising the bonding environment at rough interfaces in high-k gate stacks using electron energy loss spectroscopy
Contributors
Abstract
Organisation STFC
Keywords
Funding Information
Related Research Object(s):
Licence Information:
Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article Ultramicroscopy 110, no. 2 (2010): 105-117. doi:10.1016/j.ultramic.2009.09.013 2010