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Persistent URL http://purl.org/net/epubs/work/55320549
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Record Id 55320549
Title Impact of neutron irradiation on SiC power MOSFETs after stress tests qualification
Contributors
Abstract
Organisation ISIS , STFC , ISIS-CHIPIR
Keywords atmospheric neutrons , neutron irradiation , stress tests , failure , power device
Funding Information Università degli Studi di Palermo (PJ-GEST-FFR-2022); Università degli Studi di Palermo (PJ-GEST-FFR-2023)
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Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article Microelectron Reliab 150 (2023): 115175. doi:10.1016/j.microrel.2023.115175 2023