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Full Record Details
Persistent URL
http://purl.org/net/epubs/work/56874
Record Status
Checked
Record Id
56874
Title
Nanometer scale X-ray absorption spectroscopy and chemical states mapping of ultra thin oxides on Silicon using Electrostatic Force Microscopy
Contributors
K Sakurai
,
S De Gendt
,
N Rigopoulos
,
NRJ Poolton
,
B Hamilton
,
M Ishii
Abstract
Organisation
STFC
Keywords
Funding Information
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Language
English (EN)
Type
Details
URI(s)
Local file(s)
Year
Journal Article
Appl Phys Lett
90 (2007).
2007
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