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Persistent URL http://purl.org/net/epubs/work/57998
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Record Id 57998
Title Structure-film thickness relationship study of sputtered NiO/Ni bilayers using depth profiling and atomic force microscopy techniques
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Organisation CCLRC , SRS , 9.3
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Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article J Appl Phys 99 (12) (2006). 2006
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Science and Technology Facilities Council Switchboard: 01793 442000