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Persistent URL http://purl.org/net/epubs/work/59437
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Record Id 59437
Title The observation of oxidation-induced stacking-faults and extrinsic gettering in silicon using x-ray-diffraction topography
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Organisation SRS , SERC
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Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article Philos Mag 65 (4) (1992): 783-795. 1992