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Persistent URL http://purl.org/net/epubs/work/59632
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Record Id 59632
Title Extended X-Ray-Absorption Fine-Structure Study of the local atomic-structure in As+ heavily implanted silicon
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Organisation SRS , SERC
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Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article Phys Rev B 46 (15) (1992): 9434-9445. 1992