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Persistent URL http://purl.org/net/epubs/work/63135
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Record Id 63135
Title Neutron-Induced Upsets in NAND Floating Gate Memories
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Abstract
Organisation ISIS , ISIS-VESUVIO , STFC , ISIS-CHIPIR
Keywords ISIS 2013
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Language English (EN)
Type Details URI(s) Local file(s) Year
Journal Article IEEE Transactions on Device and Materials Reliability 12, no. 2 (2012): 437-444. doi:10.1109/TDMR.2012.2192440 2012
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