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Persistent URL http://purl.org/net/epubs/work/66107
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Record Id 66107
Title Radiation and Fault Injection Testing of a Fine-Grained Error Detection Technique for FPGAs
Abstract We present the experimental evaluation of a fine-grained hardening approach that exploits underused and abundant resources found in state-of-the-art SRAM-based FPGAs to detect radiation-induced errors on configuration memories. The technique's main goal is to provide the benefits of fine-grained redundancy, namely improved diagnosis and reduced error latency, with a reduced area overhead. Neutron experiments, validated with fault injection campaigns, demonstrate the proposed technique's efficiency when compared to the traditional dual modular redundancy.
Keywords ISIS 2013
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Language English (EN)
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Journal Article IEEE Trans Nucl Sci 60, no. 4 (2013): 2742-2749. doi:10.1109/TNS.2013.2261319 2013